Phase identification
SciPhys turns a diffraction pattern into a reviewable phase assignment with matched peaks, missing peaks, unexplained peaks, reference sticks and scientific notes.
Review likely phases without hiding uncertainty.
See which peaks still need impurity, substrate or artifact checks.
Keep peak positions, reference sticks and interpretation together.
What it does
Experimental scans rarely look like textbook patterns. SciPhys keeps weak peaks, broad peaks, shifted peaks and noisy regions visible so the user can judge whether the phase call is credible.
The most useful phase identification workflow is not only the main phase. It should help new researchers understand what may be secondary, missing, shifted or unexplained.
A phase decision becomes more valuable when it is saved with the file, sample, project, measurement details and future advisor review.
Workflow
Import raw, xy, csv, txt or xrdml diffraction files.
Detect peaks and match candidates against reference patterns.
Check matched, missing and unexplained peaks before exporting.
FAQ
SciPhys is designed to surface unexplained peaks and candidate secondary phases so impurity assignments can be reviewed instead of hidden.
The workflow can suggest candidates from the pattern, but composition hints and sample metadata make the search more reliable.
Check multiple matched peaks, missing strong reference peaks, unexplained observed peaks, peak shifts, instrument settings and sample context.