X-ray diffraction
Which crystalline phases are present, and how strong is the evidence?
Interpret the measured pattern together with reference peaks, missing reflections, unexplained signals, structure data and refinement residuals.
Analysis library
A shared analysis system for different instruments: understand the question, inspect the evidence, preserve the settings and make the conclusion reviewable.
Interpret the measured pattern together with reference peaks, missing reflections, unexplained signals, structure data and refinement residuals.
Review baseline treatment, peak position, width, intensity ratios and assignments without separating the interpretation from its preprocessing choices.
Compare corrected traces using wavelength, photon energy, FWHM, integrated intensity and centroid while retaining acquisition context.
Keep scale calibration, region selection and measurement overlays visible so morphology claims remain reviewable instead of becoming detached annotations.
Inspect topography, roughness, line profiles and local features with the scan area and processing history kept in view.
Connect cycling, rate capability, efficiency and voltage behavior across cells and protocols before drawing a performance conclusion.
Methods in practice
The SciPhys Blog turns method choices, evidence checks and common failure modes into practical research guides.