Evidence summary
Evidence summary
Reliable SEM particle sizing requires a verified pixel scale, a stated particle-size descriptor, a segmentation rule that can be audited against the image, and fields selected independently of the desired result. Report particle count, excluded objects, sampling strategy and distribution rather than only a mean.
Key takeaways
- 01Calibrate from metadata or an intact scale bar before measuring pixels.
- 02State the size definition: equivalent circular diameter, Feret diameter, area or another descriptor.
- 03Treat touching particles and edge objects with an explicit rule.
- 04Sample multiple representative fields and report the full distribution and particle count.

Verify scale before segmentation
Use original image metadata when available and cross-check the rendered scale bar. Record pixel size, magnification, working distance and any image resizing or cropping.
- Reject screenshots with uncertain scaling.
- Do not infer size from magnification alone.
- Keep the original micrograph beside the analysis copy.
Define what particle size means
Non-spherical particles do not have one diameter. Equivalent circular diameter, minimum and maximum Feret diameters, projected area and aspect ratio answer different questions.
- Choose the descriptor before measuring.
- Report shape metrics when morphology is anisotropic.
- Do not mix descriptors across samples.
Make segmentation reviewable
Overlay masks and object boundaries on the SEM image. A distribution should be traceable back to individual included, split, merged and excluded objects.
- Document threshold and cleanup rules.
- Set an edge-object policy.
- Review touching-particle separation.
Sample fields, not favorite images
Use a planned field-selection rule across independent regions or specimens. Report the number of fields, particle count and whether the distribution changes materially by field.
Methodology and scope
This guide follows static image-analysis principles and adapts them to SEM micrographs. It focuses on traceable calibration, segmentation review and sampling rather than claiming that one thresholding algorithm fits every morphology.
Limitations
- A two-dimensional projection does not uniquely recover a three-dimensional particle size or shape.
- Agglomeration, charging, contrast variation and overlapping particles can bias segmentation.
- A scale bar embedded in a resized image can be invalid if the image and bar were transformed differently.
- Fields chosen for visual appeal are not a representative sampling design.
References
- [1]
Particle size analysis — Image analysis methods — Part 1: Static image analysis methods
International Organization for Standardization. ISO 13322-1:2014 (2014).
Open source ↗ - [2]
Automatic detection of particle size distribution by image analysis
Shanthi et al.. Micron (2018).
doi:10.1016/j.micron.2017.12.002 ↗
Suggested citation
Suggested citation
SciPhys Research Team. “SEM Particle Size Analysis.” SciPhys, August 5, 2026. https://www.sciphys.com/blog/sem-particle-size-analysis
Apply the workflow
Audit particle measurements on your SEM image.
Upload the original micrograph, verify its scale and keep object masks connected to the reported distribution.